Showing results: 16 - 30 of 78 items found.
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M9033A -
Keysight Technologies
The M9033A PXIe System Synchronization Module is a dual-slot, 5-port module that provides multi-module and multi-chassis synchronization and triggering for Keysight's modular instruments.
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M9032A -
Keysight Technologies
The M9032A has a Soft Front Panel (SFP) that provides a graphical user interface to the system sync module. It allows the user to set up the most commonly used functionalities of the module. The SFP also gives you the ability to check the module's connection status, configure the reference clock and IO settings, and perform firmware udpates.
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UltraFLEX-M -
Teradyne, Inc.
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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SEE-RAD -
Hilevel Technology, Inc.
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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James Instruments Inc.
James Instruments? digital test hammers are an advanced, completely automated system for estimating concrete compressive strength. Its calculation, memory and recording functions allow for quick, easy and accurate test results.
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PDSMP50-2-01-15-CAN -
Parker Hannifin Corp.
Parker's SensoControl Service Master Plus diagnostic test kits are the premier choice for measuring, recording and analyzing critical system data for any hydraulic or pneumatic system. Up to 1 billion data points memory storage.
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MS7208 -
MiNT Systems Corporation
The MS7208 system can test a wide range of device families including – but not limited to – NAND flash, NOR flash, multi-level flash, multi-die flash, EEPROM, RAM, and mixed-technology memory devices.
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CloudTesting™ -
Cloud Testing Service, Inc.
All-in-one platform for semiconductor test and measurement Extensive test and measurement library Microcontroller, Memory, Analog and more. CloudTesting™ Service is the test and measurement system that you can build your own environment by selecting and combining Testing IPs. Fees for Testing IPs are paid monthly.
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JT 2127/Flex Socket Test Module -
JTAG Technologies Inc.
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Fluke Corporation
Get the data you want, where, how and when you want it. Fluke gives you a broad choice in data acquisition for process monitoring and laboratory test systems. You can choose a stationary or portable data logger. Transfer data to internal memory, to a removable memory card, or to your PC. Choose a standalone or distributed networked units. And you can expand your system from 20 to 1,000+ channels, depending on the series.
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BurnIn64 -
7Byte Computers
Burnin64 is a burn-in tool designed for AMD64 architecture to test the major components of computer under Windows For 64-bit Extended Systems(x86-64 platform) environment. It is specifically designed to test CPU(s), Motherboard, Memory and Hard drive(s) with the new features of x86-64 architecture in mind.
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Teledyne LeCroy
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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Keysight Technologies
The 34980A System and Control modules provide additional measurement and control capabilities that are typically used in test applications. Choose from modules that include digital I/O with programmable polarity, D/A converter with onboard memory to create waveforms, and frequency counter/totalizers.
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Neff Instrument Corporation
Identified by its ADC per channel and on-board memory, it typically operates at per channel sampling rates which in aggregate would overwhelm any communication system. Data is stored on board during a test and transmitted to a host computer following completion.
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LX-1024A+ -
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface,.·Up to 1500Vdc/1000Vac Test Voltage ,.·1024 Max. Test Points ,(Max of all series).·500 Max Files Memory,support USB or PC unlimited expansion,.·Using Embedded Linux operating system,.·Adopted high resolution colour 640*480 TFT LCD ,.·Large 320×240 LCD display ,.·Instant test time :0-60s , optional adjustment..·Providing Single-End ,Multi-segment ,Standard ,and Spot test of wire..·Auto Scan and Auto Pin Search ,.·The system provides advanced instant open-circuit, short-circuit, continuity test,.·Intermittent Conductance Test,.·Intermittent Open/Short Test ,